September 08, 2003
Computer Science Professor’s Research Could Improve Security Screening

Professor Ioannis Pavlidis joined the department of Computer Science in the spring, 2003. Dr. Pavlidis is a pioneer in high-tech biometric lie detection. In conjunction with Honeywell Laboratories and the Mayo Clinic, Dr. Pavlidis and his students are developing a lie detection technique based on the human “fright-flight response.” The premise is that the same physiological response that occurs when we are frightened can also signal willful deception. The blushing occurring around the eyes during fright-flight may be detected with thermal imaging.

Unlike conventional lie-detector tests, thermal-imaging works without hooking up subjects to monitors. In fact, subjects might not even be aware of the test as it is being conducted. This system being developed could be used for automated, high-volume screening to identify individuals intending to perform acts of terrorism, at airports, border crossings, and sensitive facilities.

Dr. Pavlidis’ work has been featured in the journal Nature, BBC News, Web M.D., The Early Show, USA Today, CNN and Science Daily Magazine.